Marvell at IEEE ITC India 2026

The IEEE International Test Conference (ITC) India is the premier event dedicated to the electronic test of devices, boards, and systems — covering the complete cycle from design verification, design-for-test (DFT), manufacturing test, silicon debug, diagnosis, reliability, and failure analysis. Now in its 10th edition, ITC India brings together design, test, and yield professionals from academia, EDA tool and equipment suppliers, and the semiconductor industry to address the challenges shaping the future of intelligent silicon.

Marvell Presentations

Panel: Mission Mode Scan Dump Using IJTAG and TAP Customization: Architecture, Implementation, and Practical Considerations 
Date: Sunday, July 19, 2026
Time: 9:15 AM – 10:45 AM IST 
Location: Arabica and Robusta
Track: Tutorials – Track 3
Marvell Speaker: Sreekanth G Pai and Raseena K A