Marvell at IEEE ITC India 2026

The IEEE International Test Conference (ITC) India is the premier event dedicated to the electronic test of devices, boards, and systems — covering the complete cycle from design verification, design-for-test (DFT), manufacturing test, silicon debug, diagnosis, reliability, and failure analysis. Now in its 10th edition, ITC India brings together design, test, and yield professionals from academia, EDA tool and equipment suppliers, and the semiconductor industry to address the challenges shaping the future of intelligent silicon. 

Marvell Presentations

Mission Mode Scan Dump Using IJTAG and TAP Customization: Architecture, Implementation, and Practical Considerations 
Date: Sunday, July 19, 2026
Time: 9:15 AM – 10:45 AM IST 
Location: Arabica and Robusta
Track: Tutorials – Track 3
Marvell Speaker: Sreekanth G Pai and Raseena K A 

Panel: The Economics of Test: Where Should We Spend the Budget? (during Banquet Sit Down Dinner, by Invite Only) 
Date: Monday, July 20, 2026
Time: 6:30 – 8:30 PM IST  
Location: Grand Victoria
Marvell Speaker: Navin Bishnoi, Vice President and India Country Manager 

System Level Test at Hyperscale: Transforming DFT for Data Infrastructure
Date: Tuesday, July 21, 2026
Time: 11:30 AM – 12:45 PM IST
Track: Industry Session 1
Location: Grand Victoria 1
Marvell Speaker: Nikhil Sudhakran, Director, Custom Solutions Engineering