7th Edition of IEEE International Test Conference

July 23-25, 2023

Marvell Presents at International Test Conference

International Test Conference is the world’s premier venue dedicated to the electronic test of devices, boards and systems, covering the complete cycle from design verification, design-for-test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement.

Marvell Presentation

Title: A Novel Test Data Compaction Method with Improved Debug Capabilities of the Signatures
Date: July 24, 2023
Time: 11:30 am – 1:00 pm
Marvell Presenters: Jaidev Shenoy, Kelly Ockunzzi and Dr. Virendra Singh

Title: Poster – “Divide And Conquer the Scan World of Mammoth SoCs with Novel Pattern Porting Approach”
Date: July 24, 2023
Time: 4:00 - 5:30 pm
Marvell Presenters: Akhtar Tamboli, Mayur Gavali, Pradeep Nagalapura and Bharat Londhe

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7th Edition of IEEE International Test Conference

Marvell Presents at International Test Conference

Marvell Presentation

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